Methods and apparatus using both nuclear capture and inelastic spectroscopy in deriving elemental concentrations

Methods and apparatus are provided for determining the content of a first element in a formation which cannot otherwise be determined via a capture spectrum measurement. The methods and apparatus utilize the inelastic spectrum measurement of the first element and the inelastic and capture spectrum m...

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Bibliographic Details
Main Authors HERRON SUSAN, ROSCOE BRADLEY, STEPHENSON KENNETH, GRAU JAMES, HERRON MICHAEL
Format Patent
LanguageEnglish
Published 31.01.2008
Subjects
DETECTING MASSES OR OBJECTS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
MEASURING
PHYSICS
TESTING
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Summary:Methods and apparatus are provided for determining the content of a first element in a formation which cannot otherwise be determined via a capture spectrum measurement. The methods and apparatus utilize the inelastic spectrum measurement of the first element and the inelastic and capture spectrum measurements of at least a second element. The methods and apparatus have particular application to determining the carbon content of a formation although they are not limited thereto. The inelastic and capture spectrum measurements of silicon are useful in making such determinations, although other chemical elements may be used as the second element.
Bibliography:Application Number: US20060496558