METHOD FOR OPTIMIZING PROBE CARD DESIGN

• Main Authors: ALLEN MICHAEL R, GORE BROOKLIN J
• Format: Patent
• Language: English
• Published: 27.12.2007
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A method is presented of designing semiconductor probe cards to have the optimum number and placement of die probe sites for function testing integrated circuit (IC) die at semiconductor wafer test, while minimizing the number of times the probe card must be moved (number of "touchdowns")...