Process control systems and methods
Process control systems and methods for semiconductor device manufacturing are disclosed. A plurality of feedback and feed-forward loops are used to accurately control the critical dimension (CD) of features formed on material layers of semiconductor devices. Semiconductor devices with features havi...
Saved in:
Main Authors | , , , , |
---|---|
Format | Patent |
Language | English |
Published |
11.10.2007
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | Process control systems and methods for semiconductor device manufacturing are disclosed. A plurality of feedback and feed-forward loops are used to accurately control the critical dimension (CD) of features formed on material layers of semiconductor devices. Semiconductor devices with features having substantially the same dimension for each die across the surface of a wafer may be fabricated using the novel process control systems and methods described herein. |
---|---|
AbstractList | Process control systems and methods for semiconductor device manufacturing are disclosed. A plurality of feedback and feed-forward loops are used to accurately control the critical dimension (CD) of features formed on material layers of semiconductor devices. Semiconductor devices with features having substantially the same dimension for each die across the surface of a wafer may be fabricated using the novel process control systems and methods described herein. |
Author | GUTMANN ALOIS LIAN JINGYU ZHUANG HAOREN LIPINSKI MATTHIAS SARMA CHANDRASEKHAR |
Author_xml | – fullname: ZHUANG HAOREN – fullname: LIPINSKI MATTHIAS – fullname: GUTMANN ALOIS – fullname: LIAN JINGYU – fullname: SARMA CHANDRASEKHAR |
BookMark | eNrjYmDJy89L5WRQDijKT04tLlZIzs8rKcrPUSiuLC5JzS1WSMxLUchNLcnITynmYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBgbmRsaWxgamjobGxKkCAIBmKVk |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
ExternalDocumentID | US2007239305A1 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_US2007239305A13 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 13:06:58 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_US2007239305A13 |
Notes | Application Number: US20060390696 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20071011&DB=EPODOC&CC=US&NR=2007239305A1 |
ParticipantIDs | epo_espacenet_US2007239305A1 |
PublicationCentury | 2000 |
PublicationDate | 20071011 |
PublicationDateYYYYMMDD | 2007-10-11 |
PublicationDate_xml | – month: 10 year: 2007 text: 20071011 day: 11 |
PublicationDecade | 2000 |
PublicationYear | 2007 |
Score | 2.681467 |
Snippet | Process control systems and methods for semiconductor device manufacturing are disclosed. A plurality of feedback and feed-forward loops are used to accurately... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
Title | Process control systems and methods |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20071011&DB=EPODOC&locale=&CC=US&NR=2007239305A1 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1JS8NAFH6Uut40Ki5VBiq5BZN0kpBDEJuFInTBNtJbmSwDgkyLifj3fTNNtKde58GsfPNm-d73AB7RpXu5ZXLDLCk3KB0UBnOpY_jU48zycM0LGY08nrijlL4unWUHPttYGKUT-qPEERFROeK9Vvv15v8RK1Lcyuop-8Ci9XOyCCK9vR2jv0TsRsMgnk2jaaiHYZDO9cmbskm1L9N5wbvSgTxIS6X9-H0o41I2u04lOYPDGdYn6nPolEKDk7DNvabB8bj58tbgSHE08woLGxxWF9Bv-P2kYZqTrSBzRZgoyDYpdHUJ_SRehCMD2139DXOVznc7ObiCrliL8hqIFLkrGOM592zqOp7PXDzmZ6bNfW7ltn0DvX013e4338Gpeq-ULA2rB93667u8R0dbZw9qfn4Bc0p_tA |
link.rule.ids | 230,309,786,891,25594,76906 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT4NAEJ409VFvihofVUlquBGBLhAOxFgoQS20sWB6a3htYmJoIxj_vrNb0J563Un2mW9nH998A3CPLt3MVIXKSkGoTMgwlxOD6LJFTJqoJq55zqKRg9DwY_Ky0Bcd-GxjYbhO6A8XR0REZYj3mu_X6_9HLJdzK6uH9AOLVo9eZLtSeztGf4nYdUf2eDZ1p47kOHY8l8I3bmNqX4r-hHelPZPp87LD0_uIxaWst52Kdwz7M6yvrE-gU5QC9Jw295oAh0Hz5S3AAedoZhUWNjisTmHQ8PvFhmkubgSZKzEpc3GTFLo6g4E3jhxfxnaXf8NcxvPtTg7PoVuuyuICRCZylycJzaipEUM3rcTAY36qaNSiaqZpl9DfVdPVbvMd9PwomCwnz-HrNRzxt0vG2FD70K2_vosbdLp1esvn6heUuYKh |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Process+control+systems+and+methods&rft.inventor=ZHUANG+HAOREN&rft.inventor=LIPINSKI+MATTHIAS&rft.inventor=GUTMANN+ALOIS&rft.inventor=LIAN+JINGYU&rft.inventor=SARMA+CHANDRASEKHAR&rft.date=2007-10-11&rft.externalDBID=A1&rft.externalDocID=US2007239305A1 |