Apparatus and method for integrated functional built-in self test for an ASIC

We describe, in exemplary embodiments, an on-chip Functional Built-In Self Test ("FBIST") mechanism for testing integrated circuits with internal memory state and complex transaction based interfaces. Such interfaces include system-on-chip applications, memory chip applications, and input/...

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Bibliographic Details
Main Authors TSAO MICHAEL M, TREMAINE R. B
Format Patent
LanguageEnglish
Published 05.07.2007
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:We describe, in exemplary embodiments, an on-chip Functional Built-In Self Test ("FBIST") mechanism for testing integrated circuits with internal memory state and complex transaction based interfaces. Such interfaces include system-on-chip applications, memory chip applications, and input/output ("IO") protocol adapter chips.
Bibliography:Application Number: US20060326540D