Lithographic apparatus and method

A lithographic apparatus is disclosed. The apparatus includes an illumination system configured to condition an extreme ultraviolet radiation beam, a patterning device configured to impart the extreme ultraviolet radiation beam with a pattern in its cross-section to form a patterned extreme ultravio...

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Main Authors THEODORUS MARIA BASTEIN ANTONIUS G, HEERENS GERT-JAN, MEILING HANS, MIERLO HUBERT A.V, DONCK JACQUES C.J, BRUG HEDSER V
Format Patent
LanguageEnglish
Published 28.06.2007
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Summary:A lithographic apparatus is disclosed. The apparatus includes an illumination system configured to condition an extreme ultraviolet radiation beam, a patterning device configured to impart the extreme ultraviolet radiation beam with a pattern in its cross-section to form a patterned extreme ultraviolet radiation beam, a substrate table constructed to hold a substrate, a projection system provided with reflective optics configured to project the patterned extreme ultraviolet radiation beam onto a target portion of the substrate, a vacuum chamber constructed to create a vacuum environment, and a detection unit arranged within the vacuum chamber to detect contamination on the patterning device.
Bibliography:Application Number: US20050317243