Temperature characteristic inspection device

Optoelectronic properties of optical communication LEDs, LDs and PDs should be examined in a wide range of temperatures between -40° C. and +85° C. Low temperature photocharacteristics of as-chip devices are tested by preparing an inspection stage cooled at a low temperature encapsulated in a shield...

Full description

Saved in:
Bibliographic Details
Main Author KAMAKURA MITSUTOSHI
Format Patent
LanguageEnglish
Published 14.06.2007
Subjects
BASIC ELECTRIC ELEMENTS
DEVICES USING STIMULATED EMISSION
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:Optoelectronic properties of optical communication LEDs, LDs and PDs should be examined in a wide range of temperatures between -40° C. and +85° C. Low temperature photocharacteristics of as-chip devices are tested by preparing an inspection stage cooled at a low temperature encapsulated in a shield casing with a front opening, conveying a chip of LD, LED or PD by a collet via the opening, placing the chip on the cold stage, blowing the stage and chip with cool dry air for preventing the chip from wetting, touching the chip by a probe, applying a current/voltage to the chip, examining emission/detection of the chip and taking the chip off via the opening by the collet.
Bibliography:Application Number: US20060637504