X-Ray Inspection Based on Scatter Detection

Systems and methods for inspecting an object with a scanned beam of penetrating radiation are disclosed. Scattered radiation from the beam is detected, in either the backward or forward direction. Characteristic values of the backscattered radiation are compared to expected reference values to chara...

Full description

Saved in:
Bibliographic Details
Main Authors CASON WILLIAM R, BAUKUS WILLIAM J, SCHUBERT JEFFREY, ROTHSCHILD PETER, SAPP WILLIAM W.JR, SCHUELLER RICHARD, CALLERAME JOSEPH
Format Patent
LanguageEnglish
Published 03.05.2007
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:Systems and methods for inspecting an object with a scanned beam of penetrating radiation are disclosed. Scattered radiation from the beam is detected, in either the backward or forward direction. Characteristic values of the backscattered radiation are compared to expected reference values to characterize the object. Additionally, penetrating radiation transmitted through the inspected object may be combined with scatter information. In certain embodiments, the inspected field of view is less than 0.1 steradians, and the detector is separate from the source of penetrating radiation and is disposed, with respect to the object, such as to subtend greater than 0.5 steradians in the field of view of the object.
Bibliography:Application Number: US20060551991