Method for predicting grain size distribution from reservoir thickness

The present invention is a method for predicting the grain size distribution at a designated location within a water-lain sedimentary deposit. Initially, the vertical thickness of the sedimentary deposit at the designated location must be determined, as well as the vertical thickness and grain size...

Full description

Saved in:
Bibliographic Details
Main Authors HOYAL DAVID C, HUH CHUN, SUN TAO, DEFFENBAUGH MAX, HEARD WILLIAM B
Format Patent
LanguageEnglish
Published 03.08.2006
Subjects
CALCULATING
COMPUTING
COUNTING
DETECTING MASSES OR OBJECTS
ELECTRIC DIGITAL DATA PROCESSING
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
MEASURING
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:The present invention is a method for predicting the grain size distribution at a designated location within a water-lain sedimentary deposit. Initially, the vertical thickness of the sedimentary deposit at the designated location must be determined, as well as the vertical thickness and grain size distribution at a second location different from the designated location. Second, a distance parameter corresponding to the two locations must be determined. Finally the distance parameter is used, along with the initially determined vertical thickness at both locations and the grain size distribution at the second location to calculate the grain size distribution at the designated location.
Bibliography:Application Number: US20050546690