Curve tracing device and method

A curve tracing method comprising simultaneously connecting a test IC sample and a reference IC sample to a switchboard; and selectively connecting a scanning voltage output or a sensing input of a curve tracer unit to each of the pins of the test IC sample and the reference IC sample via the pin sw...

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Bibliographic Details
Main Authors TAN SENG H, TAN KOK T
Format Patent
LanguageEnglish
Published 08.06.2006
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A curve tracing method comprising simultaneously connecting a test IC sample and a reference IC sample to a switchboard; and selectively connecting a scanning voltage output or a sensing input of a curve tracer unit to each of the pins of the test IC sample and the reference IC sample via the pin switches and the IC sockets.
Bibliography:Application Number: US20040992223