Method for modeling inductive effects on circuit performance

• Main Author: SAVITHRI NAGARAJ N
• Format: Patent
• Language: English
• Published: 25.05.2006
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A method for testing a partially fabricated wafer is provided that comprises the following steps: providing a device under test (DUT) and three reference oscillators overlying a substrate of the wafer; measuring the frequencies of the reference oscillators as influenced by transistor characteristics...