Wall thickness data analyzer and method

A wall thickness data analyzer is disclosed. The wall thickness data analyzer may comprise a storage device that stores a plurality of thickness data for a plurality of locations on the component, wherein one or more thickness data measured at specified times are provided for each location. The wall...

Full description

Saved in:
Bibliographic Details
Main Author HOPKINS DANIEL N
Format Patent
LanguageEnglish
Published 09.03.2006
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:A wall thickness data analyzer is disclosed. The wall thickness data analyzer may comprise a storage device that stores a plurality of thickness data for a plurality of locations on the component, wherein one or more thickness data measured at specified times are provided for each location. The wall thickness data analyzer may also comprise a processor operable to access the storage device and to perform the following: partitioning the plurality of thickness data into subsets that correspond to one or more portions of the component, and determining, for a first location associated with a first portion of the component, a first wear rate according to a statistical method selected based on the number of thickness data available for the first location.
Bibliography:Application Number: US20050166649