Lithographic apparatus and device manufacturing method

A lithographic apparatus is provided that uses an array of individually controllable elements to pattern the beam of radiation. The critical dimension uniformity of a substrate patterned using the apparatus is improved by adjusting the pattern data provided to the array of individually controllable...

Full description

Saved in:
Bibliographic Details
Main Authors TEL WIM T, BLEEKER ARNO J
Format Patent
LanguageEnglish
Published 26.01.2006
Subjects
Online AccessGet full text

Cover

Loading…