Lithographic apparatus and device manufacturing method
A lithographic apparatus is provided that uses an array of individually controllable elements to pattern the beam of radiation. The critical dimension uniformity of a substrate patterned using the apparatus is improved by adjusting the pattern data provided to the array of individually controllable...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
26.01.2006
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Subjects | |
Online Access | Get full text |
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