Lithographic apparatus and device manufacturing method

A lithographic apparatus is provided that uses an array of individually controllable elements to pattern the beam of radiation. The critical dimension uniformity of a substrate patterned using the apparatus is improved by adjusting the pattern data provided to the array of individually controllable...

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Bibliographic Details
Main Authors TEL WIM T, BLEEKER ARNO J
Format Patent
LanguageEnglish
Published 26.01.2006
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Summary:A lithographic apparatus is provided that uses an array of individually controllable elements to pattern the beam of radiation. The critical dimension uniformity of a substrate patterned using the apparatus is improved by adjusting the pattern data provided to the array of individually controllable elements to compensate for process variation.
Bibliography:Application Number: US20040898667