Phase-shift mask and fabrication thereof

Disclosed are phase-shift photomask and method for its fabrication. The phase-shift features of the photomask are formed by using electron-curing sol-gel coatings. Ultra-fine phase-shift features can be created according to the method. The process disclosed is simpler than conventional method for pr...

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Bibliographic Details
Main Authors UKRAINCZYK LJERKA, BELLMAN ROBERT A
Format Patent
LanguageEnglish
Published 26.05.2005
Edition7
Subjects
APPARATUS SPECIALLY ADAPTED THEREFOR
AUXILIARY PROCESSES IN PHOTOGRAPHY
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHIC PROCESSES, e.g. CINE, X-RAY, COLOUR,STEREO-PHOTOGRAPHIC PROCESSES
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES
PHYSICS
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Summary:Disclosed are phase-shift photomask and method for its fabrication. The phase-shift features of the photomask are formed by using electron-curing sol-gel coatings. Ultra-fine phase-shift features can be created according to the method. The process disclosed is simpler than conventional method for producing phase-shift photomasks.
Bibliography:Application Number: US20040950051