Partial good integrated circuit and method of testing same
An integrated circuit, including: a multiplicity of macro-circuits, each macro-circuit having the same function; a fuse bank containing a multiplicity of fuses, the state of the fuses storing test data indicating at least which macro-circuits failed a test; and means for preventing utilization of fa...
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Main Authors | , , , , , , , |
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Format | Patent |
Language | English |
Published |
03.03.2005
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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