Partial good integrated circuit and method of testing same

An integrated circuit, including: a multiplicity of macro-circuits, each macro-circuit having the same function; a fuse bank containing a multiplicity of fuses, the state of the fuses storing test data indicating at least which macro-circuits failed a test; and means for preventing utilization of fa...

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Main Authors FARNSWORTH LEONARD O, FELSKE MICHAEL Z, GILLIS PAMELA S, ST.PIERRE THOMAS, WILDER TAD J, OUELLETTE MICHAEL R, LYNCH BENJAMIN P, BARNHART CARL F
Format Patent
LanguageEnglish
Published 03.03.2005
Edition7
Subjects
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
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Summary:An integrated circuit, including: a multiplicity of macro-circuits, each macro-circuit having the same function; a fuse bank containing a multiplicity of fuses, the state of the fuses storing test data indicating at least which macro-circuits failed a test; and means for preventing utilization of failing macro-circuits during operation of the integrated circuit and a method generating a partial good integrated circuit, the method including: providing an integrated circuit have a multiplicity of macro-circuits arranged in one or more groups, each macro-circuit having the same function and a fuse bank containing fuses; testing each macro-circuit prior to a fuse programming operation; programming the fuses in the fuse bank in order to store data indicating at least which macro-circuits failed the testing step; and preventing utilization of each failing macro-circuit during operation of the integrated based on the data stored in the fuse bank.
Bibliography:Application Number: US20030651874