Partial good integrated circuit and method of testing same
An integrated circuit, including: a multiplicity of macro-circuits, each macro-circuit having the same function; a fuse bank containing a multiplicity of fuses, the state of the fuses storing test data indicating at least which macro-circuits failed a test; and means for preventing utilization of fa...
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Main Authors | , , , , , , , |
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Format | Patent |
Language | English |
Published |
03.03.2005
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Abstract | An integrated circuit, including: a multiplicity of macro-circuits, each macro-circuit having the same function; a fuse bank containing a multiplicity of fuses, the state of the fuses storing test data indicating at least which macro-circuits failed a test; and means for preventing utilization of failing macro-circuits during operation of the integrated circuit and a method generating a partial good integrated circuit, the method including: providing an integrated circuit have a multiplicity of macro-circuits arranged in one or more groups, each macro-circuit having the same function and a fuse bank containing fuses; testing each macro-circuit prior to a fuse programming operation; programming the fuses in the fuse bank in order to store data indicating at least which macro-circuits failed the testing step; and preventing utilization of each failing macro-circuit during operation of the integrated based on the data stored in the fuse bank. |
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AbstractList | An integrated circuit, including: a multiplicity of macro-circuits, each macro-circuit having the same function; a fuse bank containing a multiplicity of fuses, the state of the fuses storing test data indicating at least which macro-circuits failed a test; and means for preventing utilization of failing macro-circuits during operation of the integrated circuit and a method generating a partial good integrated circuit, the method including: providing an integrated circuit have a multiplicity of macro-circuits arranged in one or more groups, each macro-circuit having the same function and a fuse bank containing fuses; testing each macro-circuit prior to a fuse programming operation; programming the fuses in the fuse bank in order to store data indicating at least which macro-circuits failed the testing step; and preventing utilization of each failing macro-circuit during operation of the integrated based on the data stored in the fuse bank. |
Author | ST.PIERRE THOMAS WILDER TAD J FELSKE MICHAEL Z OUELLETTE MICHAEL R GILLIS PAMELA S FARNSWORTH LEONARD O BARNHART CARL F LYNCH BENJAMIN P |
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Snippet | An integrated circuit, including: a multiplicity of macro-circuits, each macro-circuit having the same function; a fuse bank containing a multiplicity of... |
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SubjectTerms | INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING |
Title | Partial good integrated circuit and method of testing same |
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