Method and apparatus for interconnect built-in self test based system management failure monitoring

A method and apparatus for Interconnect Built-In Self-Test (IBIST) Based System Management Failure Monitoring provides for measuring operating conditions of interconnects between a first device and a second device for system management of a post-production system. Results from the measuring are gene...

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Bibliographic Details
Main Authors CARR RUSSELL L, NEJEDLO JAY J, SLAIGHT THOMAS M
Format Patent
LanguageEnglish
Published 30.09.2004
Edition7
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A method and apparatus for Interconnect Built-In Self-Test (IBIST) Based System Management Failure Monitoring provides for measuring operating conditions of interconnects between a first device and a second device for system management of a post-production system. Results from the measuring are generated. System management failure monitoring of the post-production system is based on the generated results.
Bibliography:Application Number: US20030404244