Method for selective trimming of gate structures and apparatus formed thereby

A method for forming a trimmed gate in a transistor comprises the steps of forming a polysilicon gate conductor on a semiconductor substrate and trimming the polysilicon portion by a film growth method chosen from among selective surface oxidation and selective surface nitridation. The trimming step...

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Bibliographic Details
Main Authors HAKEY MARK C, HOLMES STEVEN J, HORAK DAVID V, FURUKAWA TOSHIHARU, RABIDOUX PAUL A
Format Patent
LanguageEnglish
Published 16.09.2004
Edition7
Subjects
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