Method of optimizing target quantities for optical precision measurement and apparatus therefor

A method for optimizing target quantities for optical precision measuring includes obtaining ancillary parameters from image data of a workpiece which is to be measured. Control data for influence quantities of the target quantities are derived from the ancillary parameters. The control data is deri...

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Bibliographic Details
Main Authors LINSS GERHARD, NEHSE UWE, KUHN OLAF
Format Patent
LanguageEnglish
Published 08.07.2004
Edition7
Subjects
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
GYROSCOPIC INSTRUMENTS
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING DISTANCES, LEVELS OR BEARINGS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
NAVIGATION
PHOTOGRAMMETRY OR VIDEOGRAMMETRY
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
SURVEYING
TESTING
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Summary:A method for optimizing target quantities for optical precision measuring includes obtaining ancillary parameters from image data of a workpiece which is to be measured. Control data for influence quantities of the target quantities are derived from the ancillary parameters. The control data is derived as follows: by determining the courses of the ancillary parameters depending on at least one influence quantity and the courses of the ancillary parameters are determined in such a way that the courses have a like extremum of the functional dependence from the influence quantities. An overall course of the ancillary parameters is determined and an extremum of the overall course of the ancillary parameters is determined. Corresponding values of the influence quantities are determined at the site of the determined extremum as control data for the influence quantity.
Bibliography:Application Number: US20030687914