Scan cell systems and methods

• Main Authors: MCFARLAND GRANT W, SUNKERNENI PAVAN R, JABER TALAL K, SABBAVARAPU ANIL K, WU DAVID M
• Format: Patent
• Language: English
• Published: 24.06.2004
• Edition: 7
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

According to some embodiments, a circuit includes a Domino state element, a master latch to receive a first clock signal and to store a value in the Domino state element in response to the first clock signal, and a slave latch to receive a second clock signal and to output the value in response to the second clock signal. Some embodiments provide a first state element coupled to a first node, a master latch coupled to the first state element, the master latch to receive a first storage signal, a first load signal, a first clock signal and a first scan value signal, a second state element coupled to a second node, the second node sequential to the first node, and a slave latch coupled to the second state element, the slave latch to receive a second storage signal, a second load signal, a second clock signal and a second scan value signal.