Photosensitive resin composition controlling solubility and pattern formation method of double-layer structure using the same

The present invention relates to a new photosensitive resin composition capable of solubility control and a pattern formation method of a double-layer structure using the same, and more particularly to a photosensitive resin composition that can control the gamma-value using a new photopolymerizatio...

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Bibliographic Details
Main Authors KIM GIL-LAE, PARK CHOON-HO, PARK CHAN-SEOK, YANG SEOK-YOON, RHO SOO-GUY
Format Patent
LanguageEnglish
Published 17.06.2004
Edition7
Subjects
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Summary:The present invention relates to a new photosensitive resin composition capable of solubility control and a pattern formation method of a double-layer structure using the same, and more particularly to a photosensitive resin composition that can control the gamma-value using a new photopolymerization initiator and lower layer hardener and that can control a film thickness according to the exposure energy without pattern breakup, even with low exposure energy. This photosensitive resin composition is useful for color filters and overcoating materials of LCD (liquid crystal display) manufacturing processes.
Bibliography:Application Number: US20030675455