Semiconductor device and method of the semiconductor device

• Main Authors: SUGAWARA MIKIO, HONMA KAZUKI, WADA MASASHI, KAWAJIRI YOSHIKI, SONOYAMA HIROFUMI
• Format: Patent
• Language: English
• Published: 17.06.2004
• Edition: 7
• Subjects: INFORMATION STORAGE; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; STATIC STORES; TESTING

Disclosed are a semiconductor chip which is uniquely value-added, a semiconductor integrated circuit device which improves the productivity and yield of products and facilitates the production management, and a method of manufacturing of semiconductor integrated circuit devices which enables the improvement of productivity and yield of products and the rational demand-responsive production management. The semiconductor chip includes a common circuit block which is operative at a first voltage and a second voltage that is higher than the first voltage, a first circuit block which is designed to fit the first voltage and operate in unison with the common circuit block, a second circuit block which is designed to fit the second voltage and operate in unison with the common circuit block, and a voltage type setup circuit which activates one of the first and second circuit blocks, with a first identification record indicative of the operability at the first voltage or a second identification record indicative of the operability only at the second voltage being held by the chip.