Method and apparatus for testing transducer heads in magnetic storage systems

An apparatus and associated testing method for identifying void heads in magnetic storage systems in which a first bit error rate is determined using data written at a first overshoot amount. A second bit error rate is determined using data written at a second rate current in a second overshoot amou...

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Bibliographic Details
Main Authors TECK SAY KWEE, HEW EDWARD YK, NGWE MYINT, LOH DAVID KL, LEONG WONG HON, CHEW VICTOR WK
Format Patent
LanguageEnglish
Published 02.10.2003
Edition7
Subjects
INFORMATION STORAGE
INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER
PHYSICS
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Summary:An apparatus and associated testing method for identifying void heads in magnetic storage systems in which a first bit error rate is determined using data written at a first overshoot amount. A second bit error rate is determined using data written at a second rate current in a second overshoot amount. A physically damaged transducer head is identified based upon a comparison of the first bit error rate to the second bit error rate.
Bibliography:Application Number: US20020261010