Method for position and/or angle measurement by means of gratings

The present invention relates to an optical measurement device, comprising first phase grating and second phase grating, a light source, and at least two optical detectors, said first and second gratings being stationary binary gratings on transparent carrier. The first phase grating is arranged to...

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Bibliographic Details
Main Authors MAGNUSSON ANDERS, HARD SVERKER
Format Patent
LanguageEnglish
Published 25.09.2003
Edition7
Subjects
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
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Summary:The present invention relates to an optical measurement device, comprising first phase grating and second phase grating, a light source, and at least two optical detectors, said first and second gratings being stationary binary gratings on transparent carrier. The first phase grating is arranged to be reproduced on said second phase grating upon illumination with the light source, which reproduction is coherently achieved, so that periods of the image of the first phase grating and the second phase grating are in an integral relationship with respect to one another, and so that the grating lines of the image of one grating and the other grating are parallel. A relative positional displacement between the image of one phase grating on the other phase grating is registered by said at least two optical detectors.
Bibliography:Application Number: US20020296963