Material property detection system and method

According to the disclosed embodiment of the present invention, a system and method for detecting properties of a material are provided using a detection apparatus including a pair of reflecting surfaces, and directing electromagnetic radiation into the apparatus. The radiation is focused through a...

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Bibliographic Details
Main Authors PAULSON DOUGLAS N, STARR TATIANA N
Format Patent
LanguageEnglish
Published 28.11.2002
Edition7
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:According to the disclosed embodiment of the present invention, a system and method for detecting properties of a material are provided using a detection apparatus including a pair of reflecting surfaces, and directing electromagnetic radiation into the apparatus. The radiation is focused through a slab of material having a negative refractive index to a subwavelength spot. Electromagnetic radiation is detected to determine characteristics of a sample under test.
Bibliography:Application Number: US20020155096