Electroless metal liner formation methods
A semiconductor structure, having a semiconductor dielectric material having an opening. A first material lining the opening, the first material comprising MXY, where M is selected from the group consisting of cobalt and nickel, X is selected from the group consisting of tungsten and silicon and Y i...
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Main Authors | , , , , |
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Format | Patent |
Language | English |
Published |
27.06.2002
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Abstract | A semiconductor structure, having a semiconductor dielectric material having an opening. A first material lining the opening, the first material comprising MXY, where M is selected from the group consisting of cobalt and nickel, X is selected from the group consisting of tungsten and silicon and Y is selected from the group consisting of phosphorus and boron and a second material filling the lined dielectric material. |
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AbstractList | A semiconductor structure, having a semiconductor dielectric material having an opening. A first material lining the opening, the first material comprising MXY, where M is selected from the group consisting of cobalt and nickel, X is selected from the group consisting of tungsten and silicon and Y is selected from the group consisting of phosphorus and boron and a second material filling the lined dielectric material. |
Author | LOCKE PETER S RUBINO JUDITH M BOETTCHER STEVEN H SAMBUCETTI CARLOS J SEO SOONON |
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Snippet | A semiconductor structure, having a semiconductor dielectric material having an opening. A first material lining the opening, the first material comprising... |
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SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | Electroless metal liner formation methods |
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