Fault tolerant storage cell

A storage cell of an integrated circuit is operable in a radiation environment to capture and store at predetermined time intervals a time sample of a data input signal. A signal representative of the stored data sample for each time interval is generated at an output of the storage cell. The storag...

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Bibliographic Details
Main Authors JAMES ROBERT W, CANALES TIMOTHY J, WHITE MICHAEL L, WALDIE ARTHUR H
Format Patent
LanguageEnglish
Published 08.11.2001
Edition7
Subjects
BASIC ELECTRONIC CIRCUITRY
ELECTRICITY
INFORMATION STORAGE
PHYSICS
PULSE TECHNIQUE
STATIC STORES
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Summary:A storage cell of an integrated circuit is operable in a radiation environment to capture and store at predetermined time intervals a time sample of a data input signal. A signal representative of the stored data sample for each time interval is generated at an output of the storage cell. The storage cell comprises at least three data capturing circuits, each operable to capture and store a time sample of the data input signal at each predetermined time interval, the stored data sample of each circuit being generated correspondingly at an output thereof. Coupled to the outputs of the data capturing circuits is a circuit for generating a signal representative of a stored data sample selected from at least two of the circuit outputs. Also coupled to the data capturing circuits is a circuit for causing each data capturing circuit to capture a different time sample of the input data signal from the other data capturing circuits over each predetermined time interval. In one embodiment, the data input signal is a time varying digital signal and each data capturing circuit comprises a latching circuit so that the storage cell may encounter an upset by a radiation particle without affecting substantially the state of the output of the storage cell.
Bibliography:Application Number: US20010829139