Compact diffraction limited near infrared (NIR) spectrometers and related detectors

Spectrometer systems are provided including a detector array; an imaging lens assembly coupled to the detector array, the imaging lens assembly including a first element of positive optical power followed by a second element of negative optical power and a positive optical power element split into t...

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Bibliographic Details
Main Authors Strobel, Peter, Hart, Robert H
Format Patent
LanguageEnglish
Published 08.10.2024
Subjects
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:Spectrometer systems are provided including a detector array; an imaging lens assembly coupled to the detector array, the imaging lens assembly including a first element of positive optical power followed by a second element of negative optical power and a positive optical power element split into two opposing identical singlets; a dispersive element coupled to the imaging lens assembly; and a fixed focus collimator assembly coupled to the dispersive element. Related imaging lens assemblies and collimator assemblies are also provided.
Bibliography:Application Number: US201917296282