Adaptive threshold for bad flash memory blocks

A method of tracking flash memory in a storage system is provided. The method includes initializing a bad blocks threshold value and marking one or more planes or logical unit numbers (LUNs) of flash memory as bad, responsive to determining that bad blocks in the one or more planes or LUNs meet the...

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Bibliographic Details
Main Authors Kannan, Hari, Verwillow, Eric Michael, Roper, John, Mueller, Eric, Fleming, Matthew D, Boyle, John, Miladinovic, Nenad
Format Patent
LanguageEnglish
Published 10.09.2024
Subjects
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Summary:A method of tracking flash memory in a storage system is provided. The method includes initializing a bad blocks threshold value and marking one or more planes or logical unit numbers (LUNs) of flash memory as bad, responsive to determining that bad blocks in the one or more planes or LUNs meet the bad blocks threshold value. The method includes adjusting the bad blocks threshold value, responsive to exceeding a threshold number or rate of retiring planes or LUNs of flash memory, and repeating the marking and the adjusting, with the bad blocks threshold value capped at a maximum threshold value.
Bibliography:Application Number: US201916381581