Method of forming integrated assemblies having transistors configured for high-voltage applications

Some embodiments include an integrated assembly having a first gate operatively adjacent a channel region, a first source/drain region on a first side of the channel region, and a second source/drain region on an opposing second side of the channel region. The first source/drain region is spaced fro...

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Bibliographic Details
Main Authors Shafi, Zia A, Panda, Durga P, Laurin, Luca, Vigano', Sara
Format Patent
LanguageEnglish
Published 02.07.2024
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Summary:Some embodiments include an integrated assembly having a first gate operatively adjacent a channel region, a first source/drain region on a first side of the channel region, and a second source/drain region on an opposing second side of the channel region. The first source/drain region is spaced from the channel region by an intervening region. The first and second source/drain regions are gatedly coupled to one another through the channel region. A second gate is adjacent a segment of the intervening region and is spaced from the first gate by an insulative region. A lightly-doped region extends across the intervening region and is under at least a portion of the first source/drain region. Some embodiments include methods of forming integrated assemblies.
Bibliography:Application Number: US202217868683