Method of forming integrated assemblies having transistors configured for high-voltage applications
Some embodiments include an integrated assembly having a first gate operatively adjacent a channel region, a first source/drain region on a first side of the channel region, and a second source/drain region on an opposing second side of the channel region. The first source/drain region is spaced fro...
Saved in:
Main Authors | , , , |
---|---|
Format | Patent |
Language | English |
Published |
02.07.2024
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Some embodiments include an integrated assembly having a first gate operatively adjacent a channel region, a first source/drain region on a first side of the channel region, and a second source/drain region on an opposing second side of the channel region. The first source/drain region is spaced from the channel region by an intervening region. The first and second source/drain regions are gatedly coupled to one another through the channel region. A second gate is adjacent a segment of the intervening region and is spaced from the first gate by an insulative region. A lightly-doped region extends across the intervening region and is under at least a portion of the first source/drain region. Some embodiments include methods of forming integrated assemblies. |
---|---|
Bibliography: | Application Number: US202217868683 |