Semiconductor devices including through-silicon-vias and methods of manufacturing the same and semiconductor packages including the semiconductor devices

A method of manufacturing a semiconductor device is provided. The method includes forming a preliminary via structure through a portion of a substrate; partially removing the substrate to expose a portion of the preliminary via structure; forming a protection layer structure on the substrate to cove...

Full description

Saved in:
Bibliographic Details
Main Authors Fujisaki, Atsushi, Moon, Kwang-Jin, Park, Byung-Lyul, An, Jin-Ho, Choi, Ju-Il
Format Patent
LanguageEnglish
Published 18.06.2024
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:A method of manufacturing a semiconductor device is provided. The method includes forming a preliminary via structure through a portion of a substrate; partially removing the substrate to expose a portion of the preliminary via structure; forming a protection layer structure on the substrate to cover the portion of the preliminary via structure that is exposed; partially etching the protection layer structure to form a protection layer pattern structure and to partially expose the preliminary via structure; wet etching the preliminary via structure to form a via structure; and forming a pad structure on the via structure to have a flat top surface.
Bibliography:Application Number: US202117403154