Care area based defect detection

• Main Authors: Esetty, Sunil Kiran, Chandan, Narasimha Murthy Srinivasa, Kautkar, Satyajit, Rout, Sambit
• Format: Patent
• Language: English
• Published: 21.05.2024
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

There is provided a system and method of assisting defect detection on a semiconductor specimen. The method includes obtaining a first map informative of multiple care areas (CAs) to be inspected on a die; creating a plurality of bounding rectangles (BRs) enclosing the multiple CAs; and compacting the plurality of BRs to a set of compacted rectangles to meet a predefined inspection capacity while attempting to minimize a non-CA area enclosed by the set of compacted rectangles, giving rise to a second map informative of the set of compacted rectangles. The compaction comprises constructing an R-tree structure representative of the plurality of BRs and compacted rectangles, and selecting a set of nodes from the R-tree structure based on the predefined inspection capacity and representative of the set of compacted rectangles. The second map is usable for filtering a defect map indicative of defect candidate distribution on the die.