Method for calibrating at least one analytic device with multiple repeated hardware components

• Main Authors: Hilger, Anton, Arens, Nadja, Shahriari, Shirin, Intelmann, Daniel, Geistanger, Andrea
• Format: Patent
• Language: English
• Published: 14.05.2024
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

A method for calibrating at least one analytic device with repeated hardware components is disclosed and comprises providing at least one calibrator sample i having a known target value of a concentration of at least one analyte; at least one measuring step, wherein the measuring step comprises conducting at least one measurement on the calibrator sample using the analytic device, wherein at least one detector signal sijk is acquired; at least one calibration step, wherein a relationship between the detector signal and the concentration of the analyte and/or between the detector signal and a theoretical signal value is determined, wherein the calibration step comprises providing at least one parametrized function; determining calibration values by conducting a calibration based on the parametrized function; and determining an analysis function on basis of an inverse of the parametrized function and the determined calibration values.