Dynamic block categorization to improve reliability and performance in memory sub-system

A set of threshold voltage distribution width measurements are obtained for a block in a memory device. An endurance estimate is determined for the block based on the threshold voltage distribution width measurements. The endurance estimate comprises an indication of an estimated number of program/e...

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Bibliographic Details
Main Authors Kadasani, Sandeep Reddy, Righetti, Niccolo, Shukla, Pitamber, Stoller, Scott Anthony
Format Patent
LanguageEnglish
Published 30.04.2024
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:A set of threshold voltage distribution width measurements are obtained for a block in a memory device. An endurance estimate is determined for the block based on the threshold voltage distribution width measurements. The endurance estimate comprises an indication of an estimated number of program/erase cycles during which data can be reliably stored by the block. One or more parameters of the block are managed based on the endurance estimate.
Bibliography:Application Number: US202217867204