Crop yield estimation

The present disclosure provides for crop yield estimation by identifying, via image processing, a field in which a crop is grown; identifying a plurality of regions within the field; identifying, by processing growth metrics via a model, a plurality of data collection points in the plurality of regi...

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Bibliographic Details
Main Authors Appel, Ana Paula, Silva, Bruno, Rodrigues, Eduardo Rocha, De Freitas Cunha, Renato Luiz
Format Patent
LanguageEnglish
Published 19.03.2024
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Summary:The present disclosure provides for crop yield estimation by identifying, via image processing, a field in which a crop is grown; identifying a plurality of regions within the field; identifying, by processing growth metrics via a model, a plurality of data collection points in the plurality of regions, wherein a given data collection point of the plurality of data collection points within a given region of the plurality of regions is identified by multivariate analysis as representative of growing conditions in the given region; receiving in-field data linked to the data collection points of the plurality; and predicting a yield for the crop in the field based on the in-field data.
Bibliography:Application Number: US202117196674