Compressor, monitoring system, and method of monitoring compressor

• Main Authors: Takanuki, Akihiro, Okubo, Tomofumi, Suzuki, Norinaga, Tashima, Kiyomi
• Format: Patent
• Language: English
• Published: 19.03.2024
• Subjects: BLASTING; CONTROL OR REGULATING SYSTEMS IN GENERAL; CONTROL OR REGULATION OF ELECTRIC MOTORS, ELECTRIC GENERATORSOR DYNAMO-ELECTRIC CONVERTERS; CONTROLLING; CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER; ELECTRICITY; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; GENERATION; HEATING; LIGHTING; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; MECHANICAL ENGINEERING; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS; PHYSICS; POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS; REGULATING; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENTMACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENTPUMPS; TESTING; WEAPONS

A compressor, a monitoring system and a method of monitoring a compressor that make it possible to monitor the remaining lifetime of a semiconductor element of a motor control system while the processing load is reduced are provided. A compressor (1) includes: a motor control system (10) that controls the rotation speed of a motor (2); a compressor body (3) that compresses air by being driven by the motor (2); a pressure sensor (20) that is provided on the discharge side of the compressor body (3); and a running controller (11) that performs switching between load running and no-load running on the basis of the pressure sensed by the pressure sensor (20). A motor controller (26) of the motor control system (10) calculates a relative temperature of a semiconductor element relative to a reference temperature by using a temperature of the semiconductor element sensed by a temperature sensor (27) at the time of switching from no-load running to load running, and calculates an amount of change in a remaining lifetime of the semiconductor element corresponding to the relative temperature of the semiconductor element, whereby monitoring the remaining lifetime of the semiconductor element.