Semiconductor device for infrared detection, method of manufacturing semiconductor device for infrared detection and infrared detector
A semiconductor device for infrared detection comprises a stack of a first semiconductor layer, a second semiconductor layer and an optical coupling layer. The first semiconductor layer has a first type of conductivity and the second semiconductor layer has a second type of conductivity. The optical...
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Main Authors | , , , |
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Format | Patent |
Language | English |
Published |
05.03.2024
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor device for infrared detection comprises a stack of a first semiconductor layer, a second semiconductor layer and an optical coupling layer. The first semiconductor layer has a first type of conductivity and the second semiconductor layer has a second type of conductivity. The optical coupling layer comprises an optical coupler and at least a first lateral absorber region. The optical coupler is configured to deflect incident light towards the first lateral absorber region. The first lateral absorber region comprises an absorber material with a bandgap Eg in the infrared, IR. |
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Bibliography: | Application Number: US202017620059 |