Generating metrics values at component levels of a monolithic application and of a microservice of a microservices-based architecture
Monitoring and troubleshooting tools provide the capability to visualize different levels of a client's application that is deployed as a suite of independent but cooperating services (e.g., an application that includes a monolithic application and a microservices-based application), collect va...
Saved in:
Main Authors | , , |
---|---|
Format | Patent |
Language | English |
Published |
09.01.2024
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Monitoring and troubleshooting tools provide the capability to visualize different levels of a client's application that is deployed as a suite of independent but cooperating services (e.g., an application that includes a monolithic application and a microservices-based application), collect values of monitored or tracked metrics at those different levels, and visualize values of the metrics at those levels. For example, metrics values can be generated for components of the monolithic application and/or for components of a microservice of the microservice-based application. |
---|---|
Bibliography: | Application Number: US202217698851 |