Contact assembly and kelvin testing system having contact assembly

A contact assembly for a Kelvin testing system for testing integrated circuit devices is disclosed. The contact assembly includes at least one grouping of blades including a first force blade, a second force blade, a first sense blade, and a second sense blade; an electrical insulation layer dispose...

Full description

Saved in:
Bibliographic Details
Main Authors Carideo, Max A, Treibergs, Valts, Skodje, David, Hasskamp, Melissa
Format Patent
LanguageEnglish
Published 09.01.2024
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:A contact assembly for a Kelvin testing system for testing integrated circuit devices is disclosed. The contact assembly includes at least one grouping of blades including a first force blade, a second force blade, a first sense blade, and a second sense blade; an electrical insulation layer disposed between the first force blade and the first sense blade and between the second force blade and the second sense blade; and an elongated elastomer. The elastomer is configured to be retained by the first force blade, the second force blade, the first sense blade, and the second sense blade. Each of the first force blade, the second force blade, the first sense blade, and the second sense blade includes a recess having an opening and sized to receive and retain at least a portion of the elastomer.
Bibliography:Application Number: US202217732815