Method for examining a sample, and device for carrying out such a method

In a method for the examination of a sample the sample is illuminated in a sample plane along a sample line with an illuminating light beam. The sample is acted upon by a depletion or switching light beam, which overlaps in the sample plane in an overlap region at least partially spatially with the...

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Bibliographic Details
Main Authors Knebel, Werner, Fahrbach, Florian
Format Patent
LanguageEnglish
Published 05.12.2023
Subjects
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
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Summary:In a method for the examination of a sample the sample is illuminated in a sample plane along a sample line with an illuminating light beam. The sample is acted upon by a depletion or switching light beam, which overlaps in the sample plane in an overlap region at least partially spatially with the illuminating light beam and which has at least one wavelength suitable for depletion of the sample. Part of fluorescent light emanating from the sample plane is detected as detection light. The fluorescent light originating from outside a first subregion and a second subregion is at least partially suppressed and not detected.
Bibliography:Application Number: US202117223128