Machine learning based image segmentation training with contour accuracy evaluation

Improving the accuracy of predicted segmentation masks, including: extracting a ground-truth RGB image buffer and a binary contour image buffer from a ground-truth RGB image container for segmentation training; generating predicted segmentation masks from the ground-truth RGB image buffer; generatin...

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Bibliographic Details
Main Authors Chen, Mengyu, Lafuente, Michael, Chao, Ouyang, Shapiro, Stephen, Zhu, Miaoqi, Takashima, Yoshikazu, De La Rosa, Daniel
Format Patent
LanguageEnglish
Published 17.10.2023
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Summary:Improving the accuracy of predicted segmentation masks, including: extracting a ground-truth RGB image buffer and a binary contour image buffer from a ground-truth RGB image container for segmentation training; generating predicted segmentation masks from the ground-truth RGB image buffer; generating second binary contours from the predicted segmentation masks using a particular algorithm; computing a segmentation loss between manually-segmented masks of the ground-truth RGB image buffer and the predicted segmentation masks; computing a contour accuracy loss between contours of the binary contour image buffer and the binary contours of the predicted segmentation masks; computing a total loss as a weighted average of the segmentation loss and the contour accuracy loss; and generating improved binary contours by compensating the contours of the binary contour image buffer with the computed total loss, wherein the improved binary contours are used to improve the accuracy of the predicted segmentation masks.
Bibliography:Application Number: US202117179061