Methods and apparatus for decomposition to account for imperfect beamsplitters

A method includes receiving a representation of an N-mode interferometer and a representation of at least one imperfection associated with the N-mode interferometer at a processor, N being a positive integer value. The processor identifies multiple two-mode interferometers and multiple phases based...

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Bibliographic Details
Main Authors Morrison, Blair, Helt, Lukas, Dhand, Ish, Mahler, Dylan, Neuhaus, Leonhard, Prasanna Kumar, Shreya
Format Patent
LanguageEnglish
Published 05.09.2023
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:A method includes receiving a representation of an N-mode interferometer and a representation of at least one imperfection associated with the N-mode interferometer at a processor, N being a positive integer value. The processor identifies multiple two-mode interferometers and multiple phases based on the representation of the N-mode interferometer and the representation of the at least one imperfection. The multiple two-mode interferometers and the multiple phases are configured to apply a unitary transformation to an input signal. The method also includes sending a signal to cause at least one of storage or display of a representation of the multiple two-mode interferometers and a representation of the multiple phases.
Bibliography:Application Number: US202117554711