Scanning element and inductive position measuring device therewith

• Main Authors: Tiemann, Marc Oliver, Heinemann, Christoph
• Format: Patent
• Language: English
• Published: 29.08.2023
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; PHYSICS; PRINTED CIRCUITS; TARIFF METERING APPARATUS; TESTING

A scanning element includes a circuit board and electronic components. The circuit board includes first and second shielding layers, a first detector unit is arranged in first and second layers, and a second detector unit is arranged in third and fourth layers. A first straight line passes through the first detector unit and the first shielding layer but not through the second shielding layer. Starting from the first detector unit, the first shielding layer is located beyond the center plane. A second straight line passes through the second detector unit and the second shielding layer but not through the first shielding layer. Starting from the second detector unit, the second shielding layer is located beyond the center plane. The first and second straight lines are orthogonal to the center plane.