Semiconductor device having modified profile metal gate
A semiconductor device has a semiconductor substrate with a dielectric layer disposed thereon. A trench is defined in the dielectric layer. A metal gate structure is disposed in the trench. The metal gate structure includes a first layer and a second layer disposed on the first layer. The first laye...
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Main Authors | , , , , |
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Format | Patent |
Language | English |
Published |
27.06.2023
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor device has a semiconductor substrate with a dielectric layer disposed thereon. A trench is defined in the dielectric layer. A metal gate structure is disposed in the trench. The metal gate structure includes a first layer and a second layer disposed on the first layer. The first layer extends to a first height in the trench and the second layer extends to a second height in the trench; the second height is less than the first height. |
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Bibliography: | Application Number: US202117301467 |