Charge storage with electrical overstress protection

Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured...

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Bibliographic Details
Main Authors McGuinness, Patrick Martin, Clarke, David J, Cleary, John A, O'Grady, Albert C, Salcedo, Javier Alejandro, Aherne, David, O'Donnell, Alan J
Format Patent
LanguageEnglish
Published 09.05.2023
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Summary:Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
Bibliography:Application Number: US202117456307