Charge storage with electrical overstress protection
Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured...
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Main Authors | , , , , , , |
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Format | Patent |
Language | English |
Published |
09.05.2023
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Subjects | |
Online Access | Get full text |
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Summary: | Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event. |
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Bibliography: | Application Number: US202117456307 |