Apparatus and method for detecting microcrack using orthogonality analysis of mode shape vector and principal plane in resonance point

• Main Author: Kim, Chan-Jung
• Format: Patent
• Language: English
• Published: 11.04.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

This application relates to an apparatus and method for detecting a microcrack using orthogonality analysis of a mode shape vector and a principal plane in a resonance point. The apparatus may include a measurement unit comprising multiple sensors and configured to measure whether a crack exists at a measurement target, and an analysis unit configured to determine whether a crack exists, on the basis of measurement values of the respective sensors. The measurement unit includes a fixing jig configured to fix the measurement target, an excitation means configured to apply a predetermined impact to the measurement target, and multiple acceleration sensors attached at predetermined locations on the measurement target. The analysis unit may further calculate frequency responses of the measurement target to the impact applied by the excitation means, and determine whether a crack exists by analyzing the number of resonance points and independence of the resonance points.