Dark tracking, hybrid method, conical diffraction microscopy, and dark addressing

• Main Author: Sirat, Gabriel Y
• Format: Patent
• Language: English
• Published: 31.01.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS; OPTICS; PHYSICS; TESTING

A super resolution technique, intended mainly for fluorescence microscopy, acquires the three-dimensional position of an emitter, through a hybrid method, including a number of steps.In a first step the two-dimensional position of an emitter is acquired, using a technique, named in this application...