Heisenberg scaler

• Main Authors: Pagano, Guido, Porto, III, James Vincent, Eldredge, Zachary David, Gorshkov, Alexey Vyacheslavovich, Qian, Kevin Chengming, Ge, Wenchao, Monroe, Christopher Roy
• Format: Patent
• Language: English
• Published: 24.01.2023
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

A Heisenberg scaler reduces noise in quantum metrology and includes: a stimulus source that provides physical stimuli; a physical system including quantum sensors that receive a first and second physical stimuli; produces a measured action parameter; receives an perturbation pulse; and produces modal amplitude; an estimation machine that: receives the measured action parameter and produces a zeroth-order value from the measured action parameter; a gradient analyzer that: receives the measured action parameter and produces the measured action parameter and a gradient; the sensor interrogation unit that: receives the modal amplitude; receives the gradient and the measured action parameter; produces the perturbation pulse; and produces a first-order value from the modal amplitude, the gradient, and the measured action parameter; a Heisenberg determination machine that: receives the zeroth-order value; receives the first-order value; and produces a physical scalar from the zeroth-order value and the first-order value.