Substrate inspection apparatus and method of determining fault type of screen printer

• Main Authors: Lee, Duk Young, Park, Juyoun, Hwang, Ye Won, Lee, Seung Jae, Choi, Tae Min, Kim, Jong Hwan, Park, Jin Man, Yoo, Yong Ho
• Format: Patent
• Language: English
• Published: 20.12.2022
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; PHYSICS

A substrate inspection apparatus generates, when anomalies of a plurality of second solder pastes among a plurality of first solder pastes printed on a first substrate is detected, at least one image indicating a plurality of second solder pastes with anomalies detected by using an image about a fir...